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Reduced Models and Uncertainty Quantification

Yue, Yao and Feng, Lihong and Benner, Peter and Pulch, Roland and Schöps, Sebastian (2019):
Reduced Models and Uncertainty Quantification.
In: Mathematics in Industry, In: Nanoelectronic Coupled Problems Solutions, Cham, Springer, pp. 329-346, DOI: 10.1007/978-3-030-30726-4_15,
[Online-Edition: https://link.springer.com/chapter/10.1007/978-3-030-30726-4_...],
[Book Section]

Item Type: Book Section
Erschienen: 2019
Creators: Yue, Yao and Feng, Lihong and Benner, Peter and Pulch, Roland and Schöps, Sebastian
Title: Reduced Models and Uncertainty Quantification
Language: English
Title of Book: Nanoelectronic Coupled Problems Solutions
Series Name: Mathematics in Industry
Volume: 29
Place of Publication: Cham
Publisher: Springer
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Accelerator Science and Electromagnetic Fields > Computational Electromagnetics
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields)
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields) > Computational Engineering (from 01.01.2019 renamed Computational Electromagnetics)
18 Department of Electrical Engineering and Information Technology > Institute for Accelerator Science and Electromagnetic Fields
Exzellenzinitiative
Exzellenzinitiative > Graduate Schools
Exzellenzinitiative > Graduate Schools > Graduate School of Computational Engineering (CE)
Date Deposited: 11 Nov 2019 08:34
DOI: 10.1007/978-3-030-30726-4_15
Official URL: https://link.springer.com/chapter/10.1007/978-3-030-30726-4_...
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