Özdemir, Ali Deniz ; Barua, Pramit ; Pyatkov, Felix ; Hennrich, Frank ; Chen, Yuan ; Wenzel, Wolfgang ; Krupke, Ralph ; Fediai, Artem (2021)
Contact spacing controls the on-current for all-carbon field effect transistors.
In: Communications Physics, 4 (1)
doi: 10.1038/s42005-021-00747-5
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Janissek, Alexander ; Lenz, Jakob ; Giudice, Fabio del ; Gaulke, Marco ; Pyatkov, Felix ; Dehm, Simone ; Hennrich, Frank ; Wei, Li ; Chen, Yuan ; Fediai, Artem ; Kappes, Manfred ; Wenzel, Wolfgang ; Krupke, Ralph ; Weitz, R. Thomas (2021)
Ionic liquid gating of single-walled carbon nanotube devices with ultra-short channel length down to 10 nm.
In: Applied Physics Letters, 118 (6)
doi: 10.1063/5.0034792
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Kumar, Sandeep ; Dagli, Daghan ; Dehm, Simone ; Das, Chittaranjan ; Wei, Li ; Chen, Yuan ; Hennrich, Frank ; Krupke, Ralph (2020)
Vanishing Hysteresis in Carbon Nanotube Transistors Embedded in Boron Nitride/Polytetrafluoroethylene Heterolayers.
In: Physica status solidi (RRL) - Rapid research letters, 14 (8)
doi: 10.1002/pssr.202000193
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Gaulke, Marco ; Janissek, Alexander ; Peyyety, Naga Anirudh ; Alamgir, Imtiaz ; Riaz, Adnan ; Dehm, Simone ; Li, Han ; Lemmer, Uli ; Flavel, Benjamin S. ; Kappes, Manfred M. ; Hennrich, Frank ; Wei, Li ; Chen, Yuan ; Pyatkov, Felix ; Krupke, Ralph (2020)
Low-Temperature Electroluminescence Excitation Mapping of Excitons and Trions in Short-Channel Monochiral Carbon Nanotube Devices.
In: ACS Nano, 14 (3)
doi: 10.1021/acsnano.9b07207
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Wei, Li ; Flavel, Benjamin S. ; Li, Wenshan ; Krupke, Ralph ; Chen, Yuan (2017)
Exploring the upper limit of single-walled carbon nanotube purity by multiple-cycle aqueous two-phase separation.
In: Nanoscale, 9 (32)
doi: 10.1039/c7nr03302h
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Pfohl, Moritz ; Glaser, Konstantin ; Graf, Arko ; Mertens, Adrian ; Tune, Daniel D. ; Puerckhauer, Tanja ; Alam, Asiful ; Wei, Li ; Chen, Yuan ; Zaumseil, Jana ; Colsmann, Alexander ; Krupke, Ralph ; Flavel, Benjamin S. (2016)
Probing the Diameter Limit of Single Walled Carbon Nanotubes in SWCNT: Fullerene Solar Cells.
In: Advanced Energy Materials, 6 (21)
doi: 10.1002/aenm.201600890
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