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Gigler, Alexander M. and Dietz, Christian and Baumann, Maximilian and Martinez, Nicolás F. and García, Ricardo and Stark, Robert W. (2012):
Repulsive bimodal atomic force microscopy on polymers.
In: Beilstein Journal of Nanotechnology, 3pp. 456-463, ISSN 2190-4286,
[Online-Edition: http://dx.doi.org/10.3762/bjnano.3.52],
[Article]
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