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Gigler, Alexander M. and Dietz, Christian and Baumann, Maximilian and Martinez, Nicolás F. and García, Ricardo and Stark, Robert W. :
Repulsive bimodal atomic force microscopy on polymers.
 [Online-Edition: http://dx.doi.org/10.3762/bjnano.3.52]
In: Beilstein Journal of Nanotechnology, 3 pp. 456-463. ISSN 2190-4286
[Article] , (2012)

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