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YCo 5 ± x thin films with perpendicular anisotropy grown by molecular beam epitaxy

Sharma, S. ; Hildebrandt, E. ; Sharath, S.U. ; Radulov, I. ; Alff, L. :
YCo 5 ± x thin films with perpendicular anisotropy grown by molecular beam epitaxy.
[Online-Edition: http://doi.org/10.1016/j.jmmm.2017.02.020]
In: Journal of Magnetism and Magnetic Materials, 432 pp. 382-386. ISSN 03048853
[Artikel], (2017)

Offizielle URL: http://doi.org/10.1016/j.jmmm.2017.02.020

Kurzbeschreibung (Abstract)

The synthesis conditions of buffer-free (00l) oriented YCo5 and Y2Co17 thin films onto Al2O3 (0001) substrates have been explored by molecular beam epitaxy (MBE). The manipulation of the ratio of individual atomic beams of Yttrium, Y and Cobalt, Co, as well as growth rate variations allows establishing a thin film phase diagram. Highly textured YCo5±xYCo5±x thin films were stabilized with saturation magnetization of 517 emu/cm3 (0.517 MA/m), coercivity of 4 kOe (0.4 T), and anisotropy constant, K1, equal to 5.34×1065.34×106 erg/cm3 (0.53 MJ/m3). These magnetic parameters and the perpendicular anisotropy obtained without additional underlayers make the material system interesting for application in magnetic recording devices.

Typ des Eintrags: Artikel
Erschienen: 2017
Autor(en): Sharma, S. ; Hildebrandt, E. ; Sharath, S.U. ; Radulov, I. ; Alff, L.
Titel: YCo 5 ± x thin films with perpendicular anisotropy grown by molecular beam epitaxy
Sprache: Englisch
Kurzbeschreibung (Abstract):

The synthesis conditions of buffer-free (00l) oriented YCo5 and Y2Co17 thin films onto Al2O3 (0001) substrates have been explored by molecular beam epitaxy (MBE). The manipulation of the ratio of individual atomic beams of Yttrium, Y and Cobalt, Co, as well as growth rate variations allows establishing a thin film phase diagram. Highly textured YCo5±xYCo5±x thin films were stabilized with saturation magnetization of 517 emu/cm3 (0.517 MA/m), coercivity of 4 kOe (0.4 T), and anisotropy constant, K1, equal to 5.34×1065.34×106 erg/cm3 (0.53 MJ/m3). These magnetic parameters and the perpendicular anisotropy obtained without additional underlayers make the material system interesting for application in magnetic recording devices.

Titel der Zeitschrift, Zeitung oder Schriftenreihe: Journal of Magnetism and Magnetic Materials
Band: 432
Verlag: Elsevier Science Publishing
Freie Schlagworte: YCo5, MBE, Thin film phase diagram, Perpendicular anisotropy
Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Dünne Schichten
Hinterlegungsdatum: 19 Mai 2017 09:23
Offizielle URL: http://doi.org/10.1016/j.jmmm.2017.02.020
ID-Nummer: doi:10.1016/j.jmmm.2017.02.020
Sponsoren: This work was supported by the Deutscher Akademischer Austauschdienst (DAAD) and the German federal state of Hessen through its excellence program LOEWE RESPONSE.
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