Sharma, S. ; Hildebrandt, E. ; Sharath, S. U. ; Radulov, I. ; Alff, L. (2017)
YCo 5 ± x thin films with perpendicular anisotropy grown by molecular beam epitaxy.
In: Journal of Magnetism and Magnetic Materials, 432
doi: 10.1016/j.jmmm.2017.02.020
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
The synthesis conditions of buffer-free (00l) oriented YCo5 and Y2Co17 thin films onto Al2O3 (0001) substrates have been explored by molecular beam epitaxy (MBE). The manipulation of the ratio of individual atomic beams of Yttrium, Y and Cobalt, Co, as well as growth rate variations allows establishing a thin film phase diagram. Highly textured YCo5±xYCo5±x thin films were stabilized with saturation magnetization of 517 emu/cm3 (0.517 MA/m), coercivity of 4 kOe (0.4 T), and anisotropy constant, K1, equal to 5.34×1065.34×106 erg/cm3 (0.53 MJ/m3). These magnetic parameters and the perpendicular anisotropy obtained without additional underlayers make the material system interesting for application in magnetic recording devices.
Typ des Eintrags: | Artikel |
---|---|
Erschienen: | 2017 |
Autor(en): | Sharma, S. ; Hildebrandt, E. ; Sharath, S. U. ; Radulov, I. ; Alff, L. |
Art des Eintrags: | Bibliographie |
Titel: | YCo 5 ± x thin films with perpendicular anisotropy grown by molecular beam epitaxy |
Sprache: | Englisch |
Publikationsjahr: | 15 Juni 2017 |
Verlag: | Elsevier Science Publishing |
Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of Magnetism and Magnetic Materials |
Jahrgang/Volume einer Zeitschrift: | 432 |
DOI: | 10.1016/j.jmmm.2017.02.020 |
Kurzbeschreibung (Abstract): | The synthesis conditions of buffer-free (00l) oriented YCo5 and Y2Co17 thin films onto Al2O3 (0001) substrates have been explored by molecular beam epitaxy (MBE). The manipulation of the ratio of individual atomic beams of Yttrium, Y and Cobalt, Co, as well as growth rate variations allows establishing a thin film phase diagram. Highly textured YCo5±xYCo5±x thin films were stabilized with saturation magnetization of 517 emu/cm3 (0.517 MA/m), coercivity of 4 kOe (0.4 T), and anisotropy constant, K1, equal to 5.34×1065.34×106 erg/cm3 (0.53 MJ/m3). These magnetic parameters and the perpendicular anisotropy obtained without additional underlayers make the material system interesting for application in magnetic recording devices. |
Freie Schlagworte: | YCo5, MBE, Thin film phase diagram, Perpendicular anisotropy |
Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Dünne Schichten |
Hinterlegungsdatum: | 19 Mai 2017 09:23 |
Letzte Änderung: | 30 Jan 2019 12:53 |
PPN: | |
Sponsoren: | This work was supported by the Deutscher Akademischer Austauschdienst (DAAD) and the German federal state of Hessen through its excellence program LOEWE RESPONSE. |
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