Schwalke, Udo (2009):
Yield, Reliability and Variability in the Nano-Era: Will Existing Approaches Survive?
In: 14th IEEE European Test Symposium, Sevilla, Spanien, 25.-29.05.2009, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2009 |
| Creators: | Schwalke, Udo |
| Title: | Yield, Reliability and Variability in the Nano-Era: Will Existing Approaches Survive? |
| Language: | English |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Event Title: | 14th IEEE European Test Symposium |
| Event Location: | Sevilla, Spanien |
| Event Dates: | 25.-29.05.2009 |
| Date Deposited: | 29 Jun 2011 09:32 |
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