Schwalke, Udo (2009):
Yield, Reliability and Variability in the Nano-Era: Will Existing Approaches Survive?
14th IEEE European Test Symposium, Sevilla, Spanien, 25.-29.05.2009, [Conference or Workshop Item]
Item Type: | Conference or Workshop Item |
---|---|
Erschienen: | 2009 |
Creators: | Schwalke, Udo |
Title: | Yield, Reliability and Variability in the Nano-Era: Will Existing Approaches Survive? |
Language: | English |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
Event Title: | 14th IEEE European Test Symposium |
Event Location: | Sevilla, Spanien |
Event Dates: | 25.-29.05.2009 |
Date Deposited: | 29 Jun 2011 09:32 |
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Suche nach Titel in: | TUfind oder in Google |
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