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Yield, Reliability and Variability in the Nano-Era: Will Existing Approaches Survive?

Schwalke, Udo (2009):
Yield, Reliability and Variability in the Nano-Era: Will Existing Approaches Survive?
In: 14th IEEE European Test Symposium, Sevilla, Spanien, 25.-29.05.2009, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2009
Creators: Schwalke, Udo
Title: Yield, Reliability and Variability in the Nano-Era: Will Existing Approaches Survive?
Language: English
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Event Title: 14th IEEE European Test Symposium
Event Location: Sevilla, Spanien
Event Dates: 25.-29.05.2009
Date Deposited: 29 Jun 2011 09:32
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