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Application of Scanning Probe Microscopy Techniques for Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices

Schwalke, Udo (2007):
Application of Scanning Probe Microscopy Techniques for Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices.
In: ECS Transactions, 11 (3), pp. 301-315. [Article]

Item Type: Article
Erschienen: 2007
Creators: Schwalke, Udo
Title: Application of Scanning Probe Microscopy Techniques for Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices
Language: English
Journal or Publication Title: ECS Transactions
Journal volume: 11
Number: 3
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Event Title: 212th Meeting of The Electrochemical Society (ECS)
Event Location: Washington DC, USA
Event Dates: 07.-12.10.2007
Date Deposited: 20 Nov 2008 08:28
Official URL: http://dx.doi.org/10.1149/1.2778673
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