Schwalke, Udo (2007):
Application of Scanning Probe Microscopy Techniques for Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices.
In: ECS Transactions, 11 (3), pp. 301-315. [Article]
Official URL: http://dx.doi.org/10.1149/1.2778673
| Item Type: | Article |
|---|---|
| Erschienen: | 2007 |
| Creators: | Schwalke, Udo |
| Title: | Application of Scanning Probe Microscopy Techniques for Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices |
| Language: | English |
| Journal or Publication Title: | ECS Transactions |
| Journal volume: | 11 |
| Number: | 3 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Event Title: | 212th Meeting of The Electrochemical Society (ECS) |
| Event Location: | Washington DC, USA |
| Event Dates: | 07.-12.10.2007 |
| Date Deposited: | 20 Nov 2008 08:28 |
| Official URL: | http://dx.doi.org/10.1149/1.2778673 |
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