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Yield and Reliability of Nanocrystalline Graphene Field-Effect Gas Sensors

Noll, Dennis and Schwalke, Udo (2018):
Yield and Reliability of Nanocrystalline Graphene Field-Effect Gas Sensors.
Cancun, Mexico, In: AIMES 2018 /234th Meeting of the Electrochemical Society (ECS), Cancun, Mexico, 30.09.-04.10.2018, DOI: 10.1149/08609.0041ecst,
[Online-Edition: http://ecst.ecsdl.org/content/86/9/41.abstract?sid=1c3d40c0-...],
[Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2018
Creators: Noll, Dennis and Schwalke, Udo
Title: Yield and Reliability of Nanocrystalline Graphene Field-Effect Gas Sensors
Language: English
Journal or Publication Title: ECS Transactions, 86 (9) pp. 41 - 49
Place of Publication: Cancun, Mexico
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Event Title: AIMES 2018 /234th Meeting of the Electrochemical Society (ECS)
Event Location: Cancun, Mexico
Event Dates: 30.09.-04.10.2018
Date Deposited: 30 Jul 2019 09:34
DOI: 10.1149/08609.0041ecst
Official URL: http://ecst.ecsdl.org/content/86/9/41.abstract?sid=1c3d40c0-...
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