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Investigation of Transfer-free Catalytic CVD Graphene on SiO2 by Means of Conductive Atomic Force Microscopy

Noll, Dennis and Schwalke, Udo (2016):
Investigation of Transfer-free Catalytic CVD Graphene on SiO2 by Means of Conductive Atomic Force Microscopy.
Istanbul, Turkey, In: 11th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), Istanbul, Turkey, 12.-14.04.2016, DOI: 10.1109/DTIS.2016.7483899,
[Online-Edition: https://ieeexplore.ieee.org/document/7483899],
[Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2016
Creators: Noll, Dennis and Schwalke, Udo
Title: Investigation of Transfer-free Catalytic CVD Graphene on SiO2 by Means of Conductive Atomic Force Microscopy
Language: English
Place of Publication: Istanbul, Turkey
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Event Title: 11th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Event Location: Istanbul, Turkey
Event Dates: 12.-14.04.2016
Date Deposited: 30 Jul 2019 09:33
DOI: 10.1109/DTIS.2016.7483899
Official URL: https://ieeexplore.ieee.org/document/7483899
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