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A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation

Krottenthaler, M. and Schmid, Christoph and Schaufler, J. and Durst, Karsten and Göken, M. (2013):
A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation.
In: Surface and Coatings Technology, Elsevier Science Publishing Company, pp. 247-252, (215), ISSN 02578972, DOI: 10.1016/j.surfcoat.2012.08.095, [Article]

Item Type: Article
Erschienen: 2013
Creators: Krottenthaler, M. and Schmid, Christoph and Schaufler, J. and Durst, Karsten and Göken, M.
Title: A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation
Language: English
Journal or Publication Title: Surface and Coatings Technology
Number: 215
Publisher: Elsevier Science Publishing Company
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Physical Metallurgy
Date Deposited: 19 Jul 2018 11:26
DOI: 10.1016/j.surfcoat.2012.08.095
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