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A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation

Krottenthaler, M. ; Schmid, Christoph ; Schaufler, J. ; Durst, Karsten ; Göken, M. (2013):
A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation.
In: Surface and Coatings Technology, (215), pp. 247-252. Elsevier Science Publishing Company, ISSN 02578972,
DOI: 10.1016/j.surfcoat.2012.08.095,
[Article]

Item Type: Article
Erschienen: 2013
Creators: Krottenthaler, M. ; Schmid, Christoph ; Schaufler, J. ; Durst, Karsten ; Göken, M.
Title: A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation
Language: English
Journal or Publication Title: Surface and Coatings Technology
Number: 215
Publisher: Elsevier Science Publishing Company
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Physical Metallurgy
Date Deposited: 19 Jul 2018 11:26
DOI: 10.1016/j.surfcoat.2012.08.095
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