Jakobsen, A. C. ; Simons, Hugh ; Ludwig, W. ; Yildirim, C. ; Leemreize, H. ; Porz, Lukas ; Detlefs, C. ; Poulsen, H. F. (2018)
Mapping of individual dislocations with dark-field X-ray microscopy.
In: Journal of Applied Crystallography, 52 (1)
doi: 10.1107/S1600576718017302
Article, Bibliographie