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German

Kühne, G. ; Weickert, J. ; Beier, M. ; Effelsberg, W.
Van Gool, L. (ed.) (2002):
Fast Implicit Activve Contour Models.
In: Proc. Pattern Recognition 24, 24th Symposium Of DAGM, Lecture Notes in Computer Science, pp. 133 - 140,
Springer-Verlag, Berlin, [Conference or Workshop Item]

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