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Kühne, G. and Weickert, J. and Beier, M. and Effelsberg, W. Van Gool, L. (ed.) (2002):
Fast Implicit Activve Contour Models.
In: Proc. Pattern Recognition 24, 24th Symposium Of DAGM, Lecture Notes in Computer Science, Springer-Verlag, Berlin, pp. 133 - 140, [Conference or Workshop Item]

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