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Jakobsen, A. C. ; Simons, Hugh ; Ludwig, W. ; Yildirim, C. ; Leemreize, H. ; Porz, Lukas ; Detlefs, C. ; Poulsen, H. F. (2018):
Mapping of individual dislocations with dark-field X-ray microscopy.
In: Journal of Applied Crystallography, 52 (1), pp. 122-132. ISSN 0021-8898, e-ISSN 1600-5767,
DOI: 10.1107/S1600576718017302,
[Article]

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