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Perez-Garza, Hector H. and Pivak, Y. and Molina-Luna, Leopoldo and van Omme, J. T. and Spruit, Ronald G. and Sholkina, M. and Pen, M. and Xu, Q. (2017):
MEMS-Based sample carriers for simultaneous heating and biasing experiments: a platform for in-situ TEM analysis.
In: IEEE sensors letters Institute of Electrical and Electronics Engineers, pp. 18-22,
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA, 19th International Conference on Solid-State Sensors, Kaohsiung, Taiwan, 8-22 June 2017, DOI: 10.1109/TRANSDUCERS.2017.7994502,
[Conference or Workshop Item]

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