Killat, Dirk ; Kluge, Johannes von ; Umbach, Frank ; Langheinrich, Werner ; Schmitz, Richard (1997)
Measurement and modelling of sensitivity and noise of MOS magnetic field effect transistors.
In: Sensors and Actuators A : Physical, 61 (1-3)
doi: 10.1016/S0924-4247(97)80286-5
Article, Bibliographie