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Kaiser, G. ; Meyer, A. ; Friess, M. ; Riedel, Ralf ; Harris, I. ; Jacob, E. (1995)
CRITICAL COMPARISON OF ICP-OES, XRF AND FLUORINE VOLATILIZATION-FTIR SPECTROMETRY FOR THE RELIABLE DETERMINATION OF THE SILICON MAIN CONSTITUENT IN CERAMIC MATERIALS.
In: FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 352 (3-4)
doi: 10.1007/BF00322228
Article, Bibliographie
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