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Gomez-Barrero, Marta ; Drozdowski, Pawel ; Rathgeb, Christian ; Patino, Jose ; Todisco, Massimiliano ; Nautsch, Andreas ; Damer, Naser ; Priesnitz, Jannier ; Evans, Nicholas ; Busch, Christoph (2022):
Biometrics in the Era of COVID-19: Challenges and Opportunities.
In: IEEE Transactions on Technology and Society, p. 1. IEEE, ISSN 2637-6415,
DOI: 10.1109/TTS.2022.3203571,
[Article]

Drozdowski, Pawel ; Rathgeb, Christian ; Dantcheva, Antitza ; Damer, Naser ; Busch, Christoph (2020):
Demographic Bias in Biometrics: A Survey on an Emerging Challenge.
In: IEEE Transactions on Technology and Society, pp. 1-15. ISSN 2637-6415,
DOI: 10.1109/TTS.2020.2992344,
[Article]

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