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Comparison of MESFET, HEMT, and HBT device performance at high temperatures

Fricke, K. ; Krozer, ; Schüßler, (1996)
Comparison of MESFET, HEMT, and HBT device performance at high temperatures.
Conference or Workshop Item

Item Type: Conference or Workshop Item
Erschienen: 1996
Creators: Fricke, K. ; Krozer, ; Schüßler,
Type of entry: Bibliographie
Title: Comparison of MESFET, HEMT, and HBT device performance at high temperatures
Language: English
Date: 1 January 1996
Series: High - Temperature Electronics Conference <1996, Albuquerque, NM, USA>: Proceedings
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 16:04
Last Modified: 05 Mar 2013 08:39
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