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Comparison of MESFET, HEMT, and HBT device performance at high temperatures

Fricke, K. ; Krozer, V. ; Schüßler, M. (1996)
Comparison of MESFET, HEMT, and HBT device performance at high temperatures.
3rd International High Temperature Electronics Conference. Albuquerque, NM, USA (June 9-14, 1996)
Conference or Workshop Item, Bibliographie

Item Type: Conference or Workshop Item
Erschienen: 1996
Creators: Fricke, K. ; Krozer, V. ; Schüßler, M.
Type of entry: Bibliographie
Title: Comparison of MESFET, HEMT, and HBT device performance at high temperatures
Language: English
Date: 1 January 1996
Book Title: Proceedings of the 3rd International High Temperature Electronics Conference, Albuquerque, USA, June 9-14, 1996
Event Title: 3rd International High Temperature Electronics Conference
Event Location: Albuquerque, NM, USA
Event Dates: June 9-14, 1996
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 16:04
Last Modified: 28 Nov 2023 18:57
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