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Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces

Fritsche, J. ; Schulmeyer, T. ; Kraft, D. ; Thißen, A. ; Klein, Andreas ; Jaegermann, W. (2002)
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces.
In: Applied Physics Letters, 81 (12)
doi: 10.1063/1.1507830
Article, Bibliographie

Item Type: Article
Erschienen: 2002
Creators: Fritsche, J. ; Schulmeyer, T. ; Kraft, D. ; Thißen, A. ; Klein, Andreas ; Jaegermann, W.
Type of entry: Bibliographie
Title: Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces
Language: English
Date: 9 September 2002
Journal or Publication Title: Applied Physics Letters
Volume of the journal: 81
Issue Number: 12
DOI: 10.1063/1.1507830
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 21 Feb 2015 15:36
Last Modified: 12 Nov 2021 19:04
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