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Antenna-Enhanced Photocurrent Microscopy on Single-Walled Carbon Nanotubes at 30 nm Resolution

Rauhut, Nina ; Engel, Michael ; Steiner, Mathias ; Krupke, Ralph ; Avouris, Phaedon ; Hartschuh, Achim (2012)
Antenna-Enhanced Photocurrent Microscopy on Single-Walled Carbon Nanotubes at 30 nm Resolution.
In: ACS Nano, 6 (7)
doi: 10.1021/nn301979c
Article, Bibliographie

Abstract

We present the first photocurrent measurements along single carbon nanotube (CNT) devices with 30 nm resolution. Our technique is based on tip-enhanced near-field optical microscopy, exploiting the plasmonically enhanced absorption controlled by an optical nanoantenna. This allows for imaging of the zero-bias photocurrent caused by charge separation in local built-in electric fields at the contacts and close to charged particles that cannot be resolved using confocal microscopy. Simultaneously recorded Raman scattering images reveal the structural properties and the defect densities of the CNTs. Antenna-enhanced scanning photocurrent microscopy extends the available set of scanning-probe techniques by combining high-resolution photovoltaic and optical probing and could become a valuable tool for the characterization of nanoelectronic devices.

Item Type: Article
Erschienen: 2012
Creators: Rauhut, Nina ; Engel, Michael ; Steiner, Mathias ; Krupke, Ralph ; Avouris, Phaedon ; Hartschuh, Achim
Type of entry: Bibliographie
Title: Antenna-Enhanced Photocurrent Microscopy on Single-Walled Carbon Nanotubes at 30 nm Resolution
Language: English
Date: 28 May 2012
Journal or Publication Title: ACS Nano
Volume of the journal: 6
Issue Number: 7
DOI: 10.1021/nn301979c
Abstract:

We present the first photocurrent measurements along single carbon nanotube (CNT) devices with 30 nm resolution. Our technique is based on tip-enhanced near-field optical microscopy, exploiting the plasmonically enhanced absorption controlled by an optical nanoantenna. This allows for imaging of the zero-bias photocurrent caused by charge separation in local built-in electric fields at the contacts and close to charged particles that cannot be resolved using confocal microscopy. Simultaneously recorded Raman scattering images reveal the structural properties and the defect densities of the CNTs. Antenna-enhanced scanning photocurrent microscopy extends the available set of scanning-probe techniques by combining high-resolution photovoltaic and optical probing and could become a valuable tool for the characterization of nanoelectronic devices.

Alternative keywords:
Alternative keywordsLanguage
single-walled carbon nanotubes;optical antennas; tip-enhanced near-field optical microscopy; scanning photocurrent microscopy; nanoscale devicesEnglish
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Fachgebiet Molekulare Nanostrukturen
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 16 Aug 2012 07:18
Last Modified: 05 Mar 2013 10:02
PPN:
Alternative keywords:
Alternative keywordsLanguage
single-walled carbon nanotubes;optical antennas; tip-enhanced near-field optical microscopy; scanning photocurrent microscopy; nanoscale devicesEnglish
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