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Mechanism of charge decay in UV-irradiated SiO2 electret films

Amjadi, Houman ; Sessler, Gerhard M. (1999)
Mechanism of charge decay in UV-irradiated SiO2 electret films.
Conference or Workshop Item, Bibliographie

Item Type: Conference or Workshop Item
Erschienen: 1999
Creators: Amjadi, Houman ; Sessler, Gerhard M.
Type of entry: Bibliographie
Title: Mechanism of charge decay in UV-irradiated SiO2 electret films
Language: English
Date: 1 January 1999
Place of Publication: New York, NY
Publisher: IEEE
Series: Conference on Electrical Insulation and Dielectric Phenomena <68, 1999, Austin, Texas>: Proceedings. - New York, NY: IEEE, 1999. S. 78-81
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 15:59
Last Modified: 16 Jul 2014 12:57
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