Amjadi, Houman ; Sessler, Gerhard M. (1999):
Mechanism of charge decay in UV-irradiated SiO2 electret films.
In: Conference on Electrical Insulation and Dielectric Phenomena <68, 1999, Austin, Texas>: Proceedings. - New York, NY: IEEE, 1999. S. 78-81, New York, NY, IEEE, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1999 |
| Creators: | Amjadi, Houman ; Sessler, Gerhard M. |
| Title: | Mechanism of charge decay in UV-irradiated SiO2 electret films |
| Language: | English |
| Series: | Conference on Electrical Insulation and Dielectric Phenomena <68, 1999, Austin, Texas>: Proceedings. - New York, NY: IEEE, 1999. S. 78-81 |
| Place of Publication: | New York, NY |
| Publisher: | IEEE |
| Divisions: | 18 Department of Electrical Engineering and Information Technology |
| Date Deposited: | 19 Nov 2008 15:59 |
| License: | [undefiniert] |
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