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Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials

Kaiser, G. ; Meyer, A. ; Fries, M. ; Riedel, R. ; Harris, M. ; Jacob, E. ; Tölg, G. (1995):
Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials.
In: Fresenius' journal of analystical chemistry, 352 (3), pp. 318-326. Springer, DOI: 10.1007/BF00322228,
[Article]

Item Type: Article
Erschienen: 1995
Creators: Kaiser, G. ; Meyer, A. ; Fries, M. ; Riedel, R. ; Harris, M. ; Jacob, E. ; Tölg, G.
Title: Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials
Language: English
Journal or Publication Title: Fresenius' journal of analystical chemistry
Volume of the journal: 352
Issue Number: 3
Publisher: Springer
Date Deposited: 19 Nov 2008 15:58
DOI: 10.1007/BF00322228
License: [undefiniert]
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