Kaiser, G. ; Meyer, A. ; Fries, M. ; Riedel, R. ; Harris, M. ; Jacob, E. ; Tölg, G. (1995):
Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials.
In: Fresenius' journal of analystical chemistry, 352 (3), pp. 318-326. Springer, DOI: 10.1007/BF00322228,
[Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 1995 |
| Creators: | Kaiser, G. ; Meyer, A. ; Fries, M. ; Riedel, R. ; Harris, M. ; Jacob, E. ; Tölg, G. |
| Title: | Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials |
| Language: | English |
| Journal or Publication Title: | Fresenius' journal of analystical chemistry |
| Volume of the journal: | 352 |
| Issue Number: | 3 |
| Publisher: | Springer |
| Date Deposited: | 19 Nov 2008 15:58 |
| DOI: | 10.1007/BF00322228 |
| License: | [undefiniert] |
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| Suche nach Titel in: | TUfind oder in Google |
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