TU Darmstadt / ULB / TUbiblio

Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials

Kaiser, G. ; Meyer, A. ; Friess, M. ; Riedel, R. ; Harris, M. ; Jacob, E. ; Tölg, G. (1995)
Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials.
In: Fresenius' journal of analystical chemistry, 352 (3)
doi: 10.1007/BF00322228
Article, Bibliographie

Item Type: Article
Erschienen: 1995
Creators: Kaiser, G. ; Meyer, A. ; Friess, M. ; Riedel, R. ; Harris, M. ; Jacob, E. ; Tölg, G.
Type of entry: Bibliographie
Title: Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials
Language: English
Date: 1995
Publisher: Springer
Journal or Publication Title: Fresenius' journal of analystical chemistry
Volume of the journal: 352
Issue Number: 3
DOI: 10.1007/BF00322228
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Dispersive Solids
Date Deposited: 19 Nov 2008 15:58
Last Modified: 18 Dec 2023 07:31
PPN:
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details