Morokhovskii, Victor V. ; Schmidt, K. H. ; Buschhorn, G. ; Freudenberger, J. ; Genz, H. ; Kotthaus, R. ; Richter, A. ; Rzepka, M. ; Weinmann, P. M. (1997)
Polarization of parametric x radiation.
In: Physical Review Letters, 79 (22)
doi: 10.1103/PhysRevLett.79.4389
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Polarization properties of parametric x radiation (PXR) produced by E0=80.5MeV electrons interacting with a 13μm thick silicon crystal have been investigated. The direction and the degree of the linear polarization of PXR observed at about 20° with respect to the electron beam direction were determined by means of a novel method exploiting directional information of the photoelectric effect in a charge coupled device consisting of 6.8×6.8μm pixels. Comparison of the results with a newly derived theoretical expression exhibits very good agreement if on top of the basic interaction process underlying PXR effects decreasing the polarization are taken into account.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 1997 |
| Autor(en): | Morokhovskii, Victor V. ; Schmidt, K. H. ; Buschhorn, G. ; Freudenberger, J. ; Genz, H. ; Kotthaus, R. ; Richter, A. ; Rzepka, M. ; Weinmann, P. M. |
| Art des Eintrags: | Bibliographie |
| Titel: | Polarization of parametric x radiation |
| Sprache: | Englisch |
| Publikationsjahr: | 1 Dezember 1997 |
| Verlag: | APS Physics |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Physical Review Letters |
| Jahrgang/Volume einer Zeitschrift: | 79 |
| (Heft-)Nummer: | 22 |
| DOI: | 10.1103/PhysRevLett.79.4389 |
| Kurzbeschreibung (Abstract): | Polarization properties of parametric x radiation (PXR) produced by E0=80.5MeV electrons interacting with a 13μm thick silicon crystal have been investigated. The direction and the degree of the linear polarization of PXR observed at about 20° with respect to the electron beam direction were determined by means of a novel method exploiting directional information of the photoelectric effect in a charge coupled device consisting of 6.8×6.8μm pixels. Comparison of the results with a newly derived theoretical expression exhibits very good agreement if on top of the basic interaction process underlying PXR effects decreasing the polarization are taken into account. |
| Zusätzliche Informationen: | Ersch. ebenf. als: Techn. Univ. Darmstadt, FB 5, Inst. für Kernphysik: IKDA; 97/28 |
| Fachbereich(e)/-gebiet(e): | 05 Fachbereich Physik |
| Hinterlegungsdatum: | 19 Nov 2008 15:57 |
| Letzte Änderung: | 24 Aug 2022 08:30 |
| PPN: | |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
 |
Frage zum Eintrag |
Optionen (nur für Redakteure)
 |
Redaktionelle Details anzeigen |
Drucken
Impressum