Möller, Andreas ; Weinbruch, Stephan ; Stadermann, Frank J. ; Ortner, Hugo M. ; Neubeck, Klaus ; Balogh, Adam G. ; Hahn, Horst (1995):
Accuracy of film thickness determination in electron probe microanalysis.
In: Microchimica acta, 119, pp. 41-47. Springer-Verlag, ISSN 0026-3672,
[Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 1995 |
| Creators: | Möller, Andreas ; Weinbruch, Stephan ; Stadermann, Frank J. ; Ortner, Hugo M. ; Neubeck, Klaus ; Balogh, Adam G. ; Hahn, Horst |
| Title: | Accuracy of film thickness determination in electron probe microanalysis |
| Language: | English |
| Journal or Publication Title: | Microchimica acta |
| Volume of the journal: | 119 |
| Publisher: | Springer-Verlag |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Earth Science 11 Department of Materials and Earth Sciences > Earth Science > Environmental Mineralogy 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Material Analytics 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences) |
| Date Deposited: | 19 Nov 2008 15:56 |
| License: | [undefiniert] |
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