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Low frequency noise-based monitoring of the effects of RF and DC stress on AlGaN/GaN MODFETs

Valizadeh, P. ; Pavlidis, Dimitris (2003)
Low frequency noise-based monitoring of the effects of RF and DC stress on AlGaN/GaN MODFETs.
Conference or Workshop Item, Bibliographie

Item Type: Conference or Workshop Item
Erschienen: 2003
Creators: Valizadeh, P. ; Pavlidis, Dimitris
Type of entry: Bibliographie
Title: Low frequency noise-based monitoring of the effects of RF and DC stress on AlGaN/GaN MODFETs
Language: English
Date: 1 January 2003
Place of Publication: Piscataway, NJ
Publisher: IEEE Service Center
Series: GaAs IC Symposium <25, 2003, San Diego, Calif.>: Technical digest 2003 ...- Piscataway, NJ: IEEE Service Center, 2003.- 304 S.- ISBN 0-7803-7833-4.- S. 78-81
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 20 Nov 2008 08:18
Last Modified: 05 Mar 2013 08:59
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