Lal, K. ; Hartnagel, H. L. ; Goswami, N. ; Thoma, P. (2000):
Experimental evaluation of on-chip measurement of charge transfer by X-rays.
In: Electronics letters, 36, [Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 2000 |
| Creators: | Lal, K. ; Hartnagel, H. L. ; Goswami, N. ; Thoma, P. |
| Title: | Experimental evaluation of on-chip measurement of charge transfer by X-rays |
| Language: | English |
| Journal or Publication Title: | Electronics letters |
| Volume of the journal: | 36 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:25 |
| License: | [undefiniert] |
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