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Experimental evaluation of on-chip measurement of charge transfer by X-rays

Lal, K. ; Hartnagel, H. L. ; Goswami, N. ; Thoma, P. (2000)
Experimental evaluation of on-chip measurement of charge transfer by X-rays.
In: Electronics letters, 36
Article, Bibliographie

Item Type: Article
Erschienen: 2000
Creators: Lal, K. ; Hartnagel, H. L. ; Goswami, N. ; Thoma, P.
Type of entry: Bibliographie
Title: Experimental evaluation of on-chip measurement of charge transfer by X-rays
Language: English
Date: 2000
Journal or Publication Title: Electronics letters
Volume of the journal: 36
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:25
Last Modified: 20 Feb 2020 13:28
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