Breuer, U. ; Holzbrecher, ; Gastel, ; Becker, ; Dietze, (1997)
Comparison of SIMS and e-beam SNMS depth profiling results using oxygen, cesium and argon as primary ions.
Conference or Workshop Item
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1997 |
| Creators: | Breuer, U. ; Holzbrecher, ; Gastel, ; Becker, ; Dietze, |
| Type of entry: | Bibliographie |
| Title: | Comparison of SIMS and e-beam SNMS depth profiling results using oxygen, cesium and argon as primary ions |
| Language: | English |
| Date: | 1 January 1997 |
| Place of Publication: | Chicheter |
| Publisher: | Wiley |
| Series: | International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 391-394 |
| Edition: | Chicheter: Wiley, 1997 |
| Divisions: | 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences) 11 Department of Materials and Earth Sciences |
| Date Deposited: | 19 Nov 2008 16:23 |
| Last Modified: | 05 Mar 2013 08:46 |
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