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Online analysis of debug trace data for embedded systems

Decker, Norman ; Dreyer, Boris ; Gottschling, Philip ; Hochberger, Christian ; Lange, Alexander ; Leucker, Martin ; Scheffel, Torben ; Wegener, Simon ; Weiss, Alexander (2018)
Online analysis of debug trace data for embedded systems.
doi: 10.23919/DATE.2018.8342124
Conference or Workshop Item, Bibliographie

Item Type: Conference or Workshop Item
Erschienen: 2018
Creators: Decker, Norman ; Dreyer, Boris ; Gottschling, Philip ; Hochberger, Christian ; Lange, Alexander ; Leucker, Martin ; Scheffel, Torben ; Wegener, Simon ; Weiss, Alexander
Type of entry: Bibliographie
Title: Online analysis of debug trace data for embedded systems
Language: English
Date: 19 March 2018
Book Title: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018
DOI: 10.23919/DATE.2018.8342124
URL / URN: https://ieeexplore.ieee.org/document/8342124/
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Computer Systems Group
Date Deposited: 30 May 2018 09:04
Last Modified: 30 May 2018 09:04
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