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Number of items: 7.

Brecht, E. and Fromknecht, and Geerk, and Meyer, and Rodewald, and Schneider, and Linker, (1997):
The [113] growth direction of Yba2Cu3O7-x thin films.
In: Solid state communications. 102 (1997), S. 849-853, [Article]

Neubeck, K. and Rodewald, and Riemenschneider, and Rück, and Baumann, and Hahn, and Balogh, (1997):
Characterisation of Cu/Al2O3 interfaces after heavy ion irradiation.
In: Materials science forum. 125 (1997), S. 248-249, [Article]

Vogt, Alexander and Brandt, and Sigurdardottir, A. and Schüßler, and Pena, and Simon, and Hartnagel, H. L. and Rodewald, and Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunneling diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1691-1694, [Conference or Workshop Item]

Vogt, Alexander and Brandt, and Sigurdardottir, A. and Schüssler, and Pena, and Simon, and Hartnagel, H. L. and Rodewald, and Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics and reliability. 37 (1997), S. 1691-1694, [Article]

Vogt, Alexander and Simon, and Hartnagel, and Rodewald, and Fuess, and Ressel, and Vogel, and Würfl, (1997):
Pd-based Ohmic contacts to GaSb.
In: WOCSDICE'97 <1997, Scheveningen, NL>: Proceedings, [Conference or Workshop Item]

Rodewald, M. and Rodewald, and De Meulenaere, and van Tendeloo, G. (1997):
Real-space characterization of short-range order in Cu-Pd alloys.
In: Physical review. B 55 (1997), S. 1473-1481, [Article]

Nitsche, Robert and Winterer, and Rodewald, and Hahn, (1995):
Structure analysis of nanocrystalline ZrO2.
In: Annual Conference of the Microbeam Analysis Society <30, 1995, Breckenridge, CO>: Proceedings, [Conference or Workshop Item]

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