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Number of items: 5.

Neubeck, K. ; Rodewald, ; Riemenschneider, ; Rück, ; Baumann, ; Hahn, ; Balogh, (1997):
Characterisation of Cu/Al2O3 interfaces after heavy ion irradiation.
In: Materials science forum. 125 (1997), S. 248-249, [Article]

Vogt, Alexander ; Brandt, ; Sigurdardottir, A. ; Schüßler, ; Pena, ; Simon, ; Hartnagel, H. L. ; Rodewald, ; Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunneling diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1691-1694, [Conference or Workshop Item]

Vogt, Alexander ; Brandt, ; Sigurdardottir, A. ; Schüssler, ; Pena, ; Simon, ; Hartnagel, H. L. ; Rodewald, ; Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics and reliability. 37 (1997), S. 1691-1694, [Article]

Vogt, Alexander ; Simon, ; Hartnagel, ; Rodewald, ; Fuess, ; Ressel, ; Vogel, ; Würfl, (1997):
Pd-based Ohmic contacts to GaSb.
In: WOCSDICE'97 <1997, Scheveningen, NL>: Proceedings, [Conference or Workshop Item]

Nitsche, Robert ; Winterer, ; Rodewald, ; Hahn, (1995):
Structure analysis of nanocrystalline ZrO2.
In: Annual Conference of the Microbeam Analysis Society <30, 1995, Breckenridge, CO>: Proceedings, [Conference or Workshop Item]

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