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Dietz, Christian and Schulze, Marcus and Voss, Agnieszka and Riesch, Christian and Stark, Robert W. (2015):
Bimodal frequency-modulated atomic force microscopy with small cantilevers.
In: Nanoscale, ROYAL SOC CHEMISTRY, CAMBRIDGE, ENGLAND, pp. 1849-1856, 7, (5), ISSN 2040-3364,
[Online-Edition: http://dx.doi.org/10.1039/C4NR05907G],
[Article]

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