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Dietz, Christian ; Schulze, Marcus ; Voss, Agnieszka ; Riesch, Christian ; Stark, Robert W. (2015):
Bimodal frequency-modulated atomic force microscopy with small cantilevers.
In: Nanoscale, 7 (5), pp. 1849-1856. ROYAL SOC CHEMISTRY, CAMBRIDGE, ENGLAND, ISSN 2040-3364,
[Article]

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