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Article

Yan, Zilin and Guillon, Olivier and Wang, Steve and Martin, Christophe L. and Lee, Chul-Seung and Bouvard, Didier (2012):
Synchrotron x-ray nano-tomography characterization of the sintering of multilayered systems.
In: Applied Physics Letters, pp. 263107(1-4), 100, (26), ISSN 00036951,
[Online-Edition: http://dx.doi.org/10.1063/1.4730625],
[Article]

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