Yan, Zilin ; Guillon, Olivier ; Wang, Steve ; Martin, Christophe L. ; Lee, Chul-Seung ; Bouvard, Didier (2012)
Synchrotron x-ray nano-tomography characterization of the sintering of multilayered systems.
In: Applied Physics Letters, 100 (26)
doi: 10.1063/1.4730625
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Synchrotron x-ray nano-tomography was used to characterize the microstructures of multi-layer ceramic capacitors before and after sintering. 3D microstructures of the same sample were reconstructed and quantitatively analyzed. The discontinuities observed in inner electrodes were found to originate from initial heterogeneities of nickel powders in the electrodes. They are supposed to grow due to the constraint of adjacent dielectric layers. Dielectric layers show anisotropic shrinkage with a decrease in density as function of layer position in the multilayer.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2012 |
| Autor(en): | Yan, Zilin ; Guillon, Olivier ; Wang, Steve ; Martin, Christophe L. ; Lee, Chul-Seung ; Bouvard, Didier |
| Art des Eintrags: | Bibliographie |
| Titel: | Synchrotron x-ray nano-tomography characterization of the sintering of multilayered systems |
| Sprache: | Englisch |
| Publikationsjahr: | 25 Juni 2012 |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Applied Physics Letters |
| Jahrgang/Volume einer Zeitschrift: | 100 |
| (Heft-)Nummer: | 26 |
| DOI: | 10.1063/1.4730625 |
| Kurzbeschreibung (Abstract): | Synchrotron x-ray nano-tomography was used to characterize the microstructures of multi-layer ceramic capacitors before and after sintering. 3D microstructures of the same sample were reconstructed and quantitatively analyzed. The discontinuities observed in inner electrodes were found to originate from initial heterogeneities of nickel powders in the electrodes. They are supposed to grow due to the constraint of adjacent dielectric layers. Dielectric layers show anisotropic shrinkage with a decrease in density as function of layer position in the multilayer. |
| Freie Schlagworte: | ceramic capacitors, computerised tomography, crystal microstructure, multilayers, nickel, powders, shrinkage, sintering |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Nichtmetallisch-Anorganische Werkstoffe 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
| Hinterlegungsdatum: | 07 Jan 2013 13:02 |
| Letzte Änderung: | 05 Mär 2013 10:04 |
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