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Number of items: 8.

Article

Strunz, P. and Saroun, J. and Keiderling, U. and Wiedenmann, A. and Przenioslo, R. (2000):
General formula of determination of cross-section from measured SANS intensities.
In: Journal of applied crystallography, 33pp. 829-833, [Article]

Charalambopoulou, G. C. and Steriotis, T. A. and Stefanopoulos, K. L. and Mitropoulos, A. C. and Kanellopoulos, N. K. and Keiderling, U. (2000):
Investigation of lipid organization on Stratum Corneum by water absorption in conjunction with neutron scattering.
In: Physica, B 276-pp. 530-531, [Article]

Keiderling, U. and Wiedenmann, A. and Srdic, V. and Winterer, M. and Hahn, Horst (2000):
Nano-sized ceramics of coated alumina and circonia analyzed with SANS.
In: Journal of applied crystallography, 33pp. 483-487, [Article]

Steriotis, T. A. and Beltsios, K. and Mitropoulos, A. C. and Kanellopoulos, N. K. and Wiedenmann, A. and Keiderling, U. (2000):
SANS structural study of a microporous carbonized resole.
In: Physica, B 276-pp. 903-904, [Article]

Gilles, Ralph and Keiderling, U. and Strunz, P. and Wiedenmann, A. and Fuess, H. (2000):
Silver behenate as a standard for instrumental resolution and wavelength calibration for small angle neutron scattering.
In: Materials science forum, 321 (32), pp. 264-269, [Article]

Berlepsch, H. von and Böttcher, C. and Quart, A. and Regenbrecht, M. and Akari, A. and Keiderling, U. and Schnablegger, H. and Dähne, S. and Kirstein, S. (2000):
Surfactant-induced changes of morphology of J-aggregates: superhelix-to tubule transformation.
In: Langmuir, 16pp. 5908-5916, [Article]

Keller, T. and Krist, T. and Danzig, A. and Keiderling, U. and Mezei, F. and Wiedenmann, A. (2000):
The polarized neutron small angle scattering instrument at BENSC Berlin.
In: Nuclear instruments and methods in physics research, A 451pp. 474-479, [Article]

Keiderling, U. and Gilles, R. and Wiedenmann, A. (1999):
Application of silver behenate powder for wavelength calibration of a SANS instrument - a comprehansive study of experimental setup variations and data processing techniques.
In: Journal of applied crystallography, 32pp. 456-463, [Article]

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