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Strasik, I. and Chetvertkova, V. and Mustafin, E. and Pavlovic, M. and Belousov, A.
:
Depth profiling of residual activity of 237U fragments as a range verification technique for 238U primary ion beam.
[Online-Edition: http://link.aps.org/doi/10.1103/PhysRevSTAB.15.071001]
In:
Physical Review Special Topics - Accelerators and Beams, 15
(7)
071001-1.
[Article]
, (2012)
Print
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