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Strasik, I. ; Chetvertkova, V. ; Mustafin, E. ; Pavlovic, M. ; Belousov, A. (2012):
Depth profiling of residual activity of 237U fragments as a range verification technique for 238U primary ion beam.
In: Physical Review Special Topics - Accelerators and Beams, 15 (7), pp. 071001-1. American Physical Society, [Article]

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