TU Darmstadt / ULB / TUbiblio

Characterization of the Dielectric Breakdown Strength of Thin Elastic Films in Various Ambient Media

Förster-Zügel, Florentine and Braisz, Lukas and Schlaak, Helmut F. (2016):
Characterization of the Dielectric Breakdown Strength of Thin Elastic Films in Various Ambient Media.
In: IEEE International Conference on Dielectrics (ICD), Montpellier, France, 3-7 July 2016, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2016
Creators: Förster-Zügel, Florentine and Braisz, Lukas and Schlaak, Helmut F.
Title: Characterization of the Dielectric Breakdown Strength of Thin Elastic Films in Various Ambient Media
Language: English
Divisions: 18 Department of Electrical Engineering and Information Technology > Institute for Electromechanical Design > Microtechnology and Electromechanical Systems
18 Department of Electrical Engineering and Information Technology > Institute for Electromechanical Design
18 Department of Electrical Engineering and Information Technology
Event Title: IEEE International Conference on Dielectrics (ICD)
Event Location: Montpellier, France
Event Dates: 3-7 July 2016
Date Deposited: 02 Aug 2016 08:40
Export:

Optionen (nur für Redakteure)

View Item View Item