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Measurement Uncertainty of Time-Based and Voltage-Based Wheatstone Bridge Readout Circuits

Lotichius, Jan and Wagner, Stefan and Kupnik, Mario and Werthschützky, Roland (2015):
Measurement Uncertainty of Time-Based and Voltage-Based Wheatstone Bridge Readout Circuits.
In: IEEE Sensors 2015, Busan, Südkorea, 01.11.2015 - 04.11.2015, [Conference or Workshop Item]

Abstract

We investigate the uncertainty of a time-based approach to read out Wheatstone bridge circuits and we compare it to the classical voltage-based approach. The time-based approach utilizes electrical discharge time when the resistive sensor is connected to a charged capacitor. We compare both approaches based on measurement uncertainty models. Analytical equations are given and calculated for two integrated circuits (IC), Acam PS09 (time-based) and Texas Instruments ADS1220 (voltage-based). Expected value and measurement uncertainty are derived for both IC and parameters sorted by effect size on measurement uncertainty. Both models yield a measurement uncertainty in the range of 0.01% for a relative resistance change r=1E−2.

Item Type: Conference or Workshop Item
Erschienen: 2015
Creators: Lotichius, Jan and Wagner, Stefan and Kupnik, Mario and Werthschützky, Roland
Title: Measurement Uncertainty of Time-Based and Voltage-Based Wheatstone Bridge Readout Circuits
Language: English
Abstract:

We investigate the uncertainty of a time-based approach to read out Wheatstone bridge circuits and we compare it to the classical voltage-based approach. The time-based approach utilizes electrical discharge time when the resistive sensor is connected to a charged capacitor. We compare both approaches based on measurement uncertainty models. Analytical equations are given and calculated for two integrated circuits (IC), Acam PS09 (time-based) and Texas Instruments ADS1220 (voltage-based). Expected value and measurement uncertainty are derived for both IC and parameters sorted by effect size on measurement uncertainty. Both models yield a measurement uncertainty in the range of 0.01% for a relative resistance change r=1E−2.

Divisions: 18 Department of Electrical Engineering and Information Technology > Institute for Electromechanical Design
18 Department of Electrical Engineering and Information Technology > Institute for Electromechanical Design > Measurement and Sensor Technology
18 Department of Electrical Engineering and Information Technology
Event Title: IEEE Sensors 2015
Event Location: Busan, Südkorea
Event Dates: 01.11.2015 - 04.11.2015
Date Deposited: 04 Nov 2015 13:37
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