Lotichius, Jan ; Wagner, Stefan ; Kupnik, Mario ; Werthschützky, Roland (2015)
Measurement Uncertainty of Time-Based and Voltage-Based Wheatstone Bridge Readout Circuits.
IEEE Sensors 2015. Busan, Südkorea (01.11.2015 - 04.11.2015)
Konferenzveröffentlichung, Bibliographie
Kurzbeschreibung (Abstract)
We investigate the uncertainty of a time-based approach to read out Wheatstone bridge circuits and we compare it to the classical voltage-based approach. The time-based approach utilizes electrical discharge time when the resistive sensor is connected to a charged capacitor. We compare both approaches based on measurement uncertainty models. Analytical equations are given and calculated for two integrated circuits (IC), Acam PS09 (time-based) and Texas Instruments ADS1220 (voltage-based). Expected value and measurement uncertainty are derived for both IC and parameters sorted by effect size on measurement uncertainty. Both models yield a measurement uncertainty in the range of 0.01% for a relative resistance change r=1E−2.
| Typ des Eintrags: | Konferenzveröffentlichung |
|---|---|
| Erschienen: | 2015 |
| Autor(en): | Lotichius, Jan ; Wagner, Stefan ; Kupnik, Mario ; Werthschützky, Roland |
| Art des Eintrags: | Bibliographie |
| Titel: | Measurement Uncertainty of Time-Based and Voltage-Based Wheatstone Bridge Readout Circuits |
| Sprache: | Englisch |
| Publikationsjahr: | 1 November 2015 |
| Veranstaltungstitel: | IEEE Sensors 2015 |
| Veranstaltungsort: | Busan, Südkorea |
| Veranstaltungsdatum: | 01.11.2015 - 04.11.2015 |
| Kurzbeschreibung (Abstract): | We investigate the uncertainty of a time-based approach to read out Wheatstone bridge circuits and we compare it to the classical voltage-based approach. The time-based approach utilizes electrical discharge time when the resistive sensor is connected to a charged capacitor. We compare both approaches based on measurement uncertainty models. Analytical equations are given and calculated for two integrated circuits (IC), Acam PS09 (time-based) and Texas Instruments ADS1220 (voltage-based). Expected value and measurement uncertainty are derived for both IC and parameters sorted by effect size on measurement uncertainty. Both models yield a measurement uncertainty in the range of 0.01% for a relative resistance change r=1E−2. |
| Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Elektromechanische Konstruktionen (aufgelöst 18.12.2018) 18 Fachbereich Elektrotechnik und Informationstechnik > Mess- und Sensortechnik 18 Fachbereich Elektrotechnik und Informationstechnik |
| Hinterlegungsdatum: | 04 Nov 2015 13:37 |
| Letzte Änderung: | 04 Nov 2015 13:54 |
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