TU Darmstadt / ULB / TUbiblio

Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces

Fritsche, J. and Schulmeyer, T. and Kraft, D. and Thißen, A. and Klein, Andreas and Jaegermann, W. (2002):
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces.
81, In: Applied Physics Letters, (12), pp. 2297-2299. ISSN 00036951,
[Article]

Item Type: Article
Erschienen: 2002
Creators: Fritsche, J. and Schulmeyer, T. and Kraft, D. and Thißen, A. and Klein, Andreas and Jaegermann, W.
Title: Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces
Language: English
Journal or Publication Title: Applied Physics Letters
Volume: 81
Number: 12
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 21 Feb 2015 15:36
Official URL: http://dx.doi.org/10.1063/1.1507830
Identification Number: doi:10.1063/1.1507830
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details