Ahmed, Furqan and Krottenthaler, Markus and Schmid, Christoph and Durst, Karsten (2013):
Assessment of stress relaxation experiments on diamond coatings analyzed by digital image correlation and micro-Raman spectroscopy.
In: Surface and Coatings Technology, Elsevier Science Publishing, pp. 255-260, 237, ISSN 02578972, [Online-Edition: http://dx.doi.org/10.1016/j.surfcoat.2013.07.025],
[Article]
Abstract
The analysis and control of residual stresses are important for understanding the fracture and delamination behavior of coatings and thin films. In this work, the stress relaxation in microcrystalline diamond coatings after focused ion beam (FIB) milling was assessed by micro-Raman spectroscopy and digital image correlation. Using the FIB, the so called H-Bar geometry was milled in the diamond coating. The cutting introduced a strain relief in the coating perpendicular to the longer sides of the bar. The relaxation strains were recorded from high resolution scanning electron microscopy images of the H-Bar before and after FIB cutting. Using finite element modeling of the milled geometry, the residual stress level in the coating is evaluated from the relaxation strains. Furthermore, μ-Raman spectroscopy was used to assess the biaxial residual stress level in the coating before and after FIB cutting. The μ-Raman signal inside the bar showed strong incidence for stress relaxation and confirmed to some extent the applicability of the FIB–DIC method.
| Item Type: | Article |
|---|---|
| Erschienen: | 2013 |
| Creators: | Ahmed, Furqan and Krottenthaler, Markus and Schmid, Christoph and Durst, Karsten |
| Title: | Assessment of stress relaxation experiments on diamond coatings analyzed by digital image correlation and micro-Raman spectroscopy |
| Language: | English |
| Abstract: | The analysis and control of residual stresses are important for understanding the fracture and delamination behavior of coatings and thin films. In this work, the stress relaxation in microcrystalline diamond coatings after focused ion beam (FIB) milling was assessed by micro-Raman spectroscopy and digital image correlation. Using the FIB, the so called H-Bar geometry was milled in the diamond coating. The cutting introduced a strain relief in the coating perpendicular to the longer sides of the bar. The relaxation strains were recorded from high resolution scanning electron microscopy images of the H-Bar before and after FIB cutting. Using finite element modeling of the milled geometry, the residual stress level in the coating is evaluated from the relaxation strains. Furthermore, μ-Raman spectroscopy was used to assess the biaxial residual stress level in the coating before and after FIB cutting. The μ-Raman signal inside the bar showed strong incidence for stress relaxation and confirmed to some extent the applicability of the FIB–DIC method. |
| Journal or Publication Title: | Surface and Coatings Technology |
| Volume: | 237 |
| Publisher: | Elsevier Science Publishing |
| Uncontrolled Keywords: | Focused ion beam (FIB), Stress relaxation, Digital image correlation (DIC), Microcrystalline diamond, Raman spectroscopy |
| Divisions: | 11 Department of Materials and Earth Sciences > Material Science > Physical Metallurgy 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences |
| Date Deposited: | 03 Dec 2014 13:09 |
| Official URL: | http://dx.doi.org/10.1016/j.surfcoat.2013.07.025 |
| Additional Information: | Proceedings of the 40th International Conference on Metallurgical Coatings and Thin Films (ICMCTF) — ICMCTF 2013 |
| Identification Number: | doi:10.1016/j.surfcoat.2013.07.025 |
| Funders: | he authors gratefully acknowledge the funding of the German Research Foundation (DFG), which, within the framework of its ‘Excellence Initiative’ supports the Cluster of Excellence “Engineering of Advanced Materials”at the University of Erlangen-Nuremberg, as well as the frame of DFG graduate school 1229 and the DFG funded project Du-424/7-1. , Further, the authors gratefully acknowledge the financial support by the University of Engineering and Technology, Lahore-Pakistan. |
| Export: |
Optionen (nur für Redakteure)
 |
View Item |
Drucken
Impressum