Rauhut, Nina ; Engel, Michael ; Steiner, Mathias ; Krupke, Ralph ; Avouris, Phaedon ; Hartschuh, Achim (2012)
Antenna-Enhanced Photocurrent Microscopy on Single-Walled Carbon Nanotubes at 30 nm Resolution.
In: ACS Nano, 6 (7)
doi: 10.1021/nn301979c
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
We present the first photocurrent measurements along single carbon nanotube (CNT) devices with 30 nm resolution. Our technique is based on tip-enhanced near-field optical microscopy, exploiting the plasmonically enhanced absorption controlled by an optical nanoantenna. This allows for imaging of the zero-bias photocurrent caused by charge separation in local built-in electric fields at the contacts and close to charged particles that cannot be resolved using confocal microscopy. Simultaneously recorded Raman scattering images reveal the structural properties and the defect densities of the CNTs. Antenna-enhanced scanning photocurrent microscopy extends the available set of scanning-probe techniques by combining high-resolution photovoltaic and optical probing and could become a valuable tool for the characterization of nanoelectronic devices.
Typ des Eintrags: | Artikel | ||||
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Erschienen: | 2012 | ||||
Autor(en): | Rauhut, Nina ; Engel, Michael ; Steiner, Mathias ; Krupke, Ralph ; Avouris, Phaedon ; Hartschuh, Achim | ||||
Art des Eintrags: | Bibliographie | ||||
Titel: | Antenna-Enhanced Photocurrent Microscopy on Single-Walled Carbon Nanotubes at 30 nm Resolution | ||||
Sprache: | Englisch | ||||
Publikationsjahr: | 28 Mai 2012 | ||||
Titel der Zeitschrift, Zeitung oder Schriftenreihe: | ACS Nano | ||||
Jahrgang/Volume einer Zeitschrift: | 6 | ||||
(Heft-)Nummer: | 7 | ||||
DOI: | 10.1021/nn301979c | ||||
Kurzbeschreibung (Abstract): | We present the first photocurrent measurements along single carbon nanotube (CNT) devices with 30 nm resolution. Our technique is based on tip-enhanced near-field optical microscopy, exploiting the plasmonically enhanced absorption controlled by an optical nanoantenna. This allows for imaging of the zero-bias photocurrent caused by charge separation in local built-in electric fields at the contacts and close to charged particles that cannot be resolved using confocal microscopy. Simultaneously recorded Raman scattering images reveal the structural properties and the defect densities of the CNTs. Antenna-enhanced scanning photocurrent microscopy extends the available set of scanning-probe techniques by combining high-resolution photovoltaic and optical probing and could become a valuable tool for the characterization of nanoelectronic devices. |
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Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Molekulare Nanostrukturen 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
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Hinterlegungsdatum: | 16 Aug 2012 07:18 | ||||
Letzte Änderung: | 05 Mär 2013 10:02 | ||||
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