Öksüzoğlu, Ramis Mustafa ; Yıldırım, Mustafa ; Çınar, Hakan ; Hildebrandt, Erwin ; Alff, Lambert (2011)
Effect of Ta buffer and NiFe seed layers on pulsed-DC magnetron sputtered Ir20Mn80/Co90Fe10 exchange bias.
In: Journal of Magnetism and Magnetic Materials, 323 (13)
doi: 10.1016/j.jmmm.2011.02.021
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
A systematic investigation has been done on the correlation between texture, grain size evolution and magnetic properties in Ta/Ni81Fe19/Ir20Mn80/Co90Fe10/Ta exchange bias in dependence of Ta buffer and NiFe seed layer thickness in the range of 2–10 nm, deposited by pulsed DC magnetron sputtering technique. A strong dependence of 〈1 1 1〉 texture on the Ta/NiFe thicknesses was found, where the reducing and increasing texture was correlated with exchange bias field and unidirectional anisotropy energy constant at both NiFe/IrMn and IrMn/CoFe interfaces. However, a direct correlation between average grain size in IrMn and Hex and Hc was not observed. L12 phase IrMn3 could be formed by thickness optimization of Ta/NiFe layers by deposition at room temperature, for which the maximum exchange coupling parameters were achieved. We conclude finally that the coercivity is mainly influenced by texture induced interfacial effects at NiFe/IrMn/CoFe interfaces developing with Ta/NiFe thicknesses.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2011 |
| Autor(en): | Öksüzoğlu, Ramis Mustafa ; Yıldırım, Mustafa ; Çınar, Hakan ; Hildebrandt, Erwin ; Alff, Lambert |
| Art des Eintrags: | Bibliographie |
| Titel: | Effect of Ta buffer and NiFe seed layers on pulsed-DC magnetron sputtered Ir20Mn80/Co90Fe10 exchange bias |
| Sprache: | Englisch |
| Publikationsjahr: | Juli 2011 |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of Magnetism and Magnetic Materials |
| Jahrgang/Volume einer Zeitschrift: | 323 |
| (Heft-)Nummer: | 13 |
| DOI: | 10.1016/j.jmmm.2011.02.021 |
| Kurzbeschreibung (Abstract): | A systematic investigation has been done on the correlation between texture, grain size evolution and magnetic properties in Ta/Ni81Fe19/Ir20Mn80/Co90Fe10/Ta exchange bias in dependence of Ta buffer and NiFe seed layer thickness in the range of 2–10 nm, deposited by pulsed DC magnetron sputtering technique. A strong dependence of 〈1 1 1〉 texture on the Ta/NiFe thicknesses was found, where the reducing and increasing texture was correlated with exchange bias field and unidirectional anisotropy energy constant at both NiFe/IrMn and IrMn/CoFe interfaces. However, a direct correlation between average grain size in IrMn and Hex and Hc was not observed. L12 phase IrMn3 could be formed by thickness optimization of Ta/NiFe layers by deposition at room temperature, for which the maximum exchange coupling parameters were achieved. We conclude finally that the coercivity is mainly influenced by texture induced interfacial effects at NiFe/IrMn/CoFe interfaces developing with Ta/NiFe thicknesses. |
| Freie Schlagworte: | Magnetic anisotropy, Magnetic properties of monolayers and thin films. Texture, Pulsed DC magnetron sputtering |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Dünne Schichten 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
| Hinterlegungsdatum: | 30 Mär 2012 09:25 |
| Letzte Änderung: | 05 Mär 2013 10:00 |
| PPN: | |
| Sponsoren: | TUBITAK Grant no MAG-106M517, Directorate for Scientific Research Projects of University Anadolu Grant no BAP-050255, Prime Ministry State Planning Organization Grant no DPT-2004-06 |
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