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Sensitivity and noise of MOS magnetic field effect transistors

Killat, Dirk and Kluge, and Umbach, and Langheinrich, and Schmitz, and Kluge, and Umbach, and Langheinrich, and Schmitz, and Kluge, and Umbach, and Langheinrich, and Schmitz, :
Sensitivity and noise of MOS magnetic field effect transistors.
In: European Solid State Device Research Conference <26, 1996, Bologna>: Proceedings. S. 111-114 .
[Conference or Workshop Item] , (1996)

Item Type: Conference or Workshop Item
Erschienen: 1996
Creators: Killat, Dirk and Kluge, and Umbach, and Langheinrich, and Schmitz, and Kluge, and Umbach, and Langheinrich, and Schmitz, and Kluge, and Umbach, and Langheinrich, and Schmitz,
Title: Sensitivity and noise of MOS magnetic field effect transistors
Language: English
Series Name: European Solid State Device Research Conference <26, 1996, Bologna>: Proceedings. S. 111-114
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 15:55
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