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Sensitivity and noise of MOS magnetic field effect transistors

Killat, Dirk ; Kluge, ; Umbach, ; Langheinrich, ; Schmitz, ; Kluge, ; Umbach, ; Langheinrich, ; Schmitz, ; Kluge, ; Umbach, ; Langheinrich, ; Schmitz, (1996):
Sensitivity and noise of MOS magnetic field effect transistors.
In: European Solid State Device Research Conference <26, 1996, Bologna>: Proceedings. S. 111-114, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1996
Creators: Killat, Dirk ; Kluge, ; Umbach, ; Langheinrich, ; Schmitz, ; Kluge, ; Umbach, ; Langheinrich, ; Schmitz, ; Kluge, ; Umbach, ; Langheinrich, ; Schmitz,
Title: Sensitivity and noise of MOS magnetic field effect transistors
Language: English
Series Name: European Solid State Device Research Conference <26, 1996, Bologna>: Proceedings. S. 111-114
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 15:55
License: [undefiniert]
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