Euler, Sabine ; Fitzke, Erik ; Nikiforov, Oleg ; Hofmann, Daniel ; Dolejsky, Till ; Walther, Thomas (2021)
Spectral characterization of SPDC-based single-photon sources for quantum key distribution.
In: The European Physical Journal Special Topics, 230 (4)
doi: 10.1140/epjs/s11734-021-00081-5
Artikel, Bibliographie
Dies ist die neueste Version dieses Eintrags.
Kurzbeschreibung (Abstract)
In our laboratory, we employ two biphoton sources for quantum key distribution. The first is based on cw parametric down-conversion of photons at 404 nm in PPKTP waveguide chips, while the second is based on the pulsed parametric down-conversion of 775 nm photons in PPLN waveguides. The spectral characterization is important for the determination of certain side-channel attacks. A Hong-Ou-Mandel experiment employing the first photon source revealed a complex structure of the common Hong-Ou-Mandel dip. By measuring the spectra of the single photons at 808 nm, we were able to associate these structures to the superposition of different transverse modes of the pump photons in our waveguide chips. The pulsed source was characterized by means of single-photon spectra measured by a sensitive spectrum analyzer as well as dispersion-based measurements. Finally, we also describe Hong-Ou-Mandel experiments using the photons from the second source.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2021 |
| Autor(en): | Euler, Sabine ; Fitzke, Erik ; Nikiforov, Oleg ; Hofmann, Daniel ; Dolejsky, Till ; Walther, Thomas |
| Art des Eintrags: | Bibliographie |
| Titel: | Spectral characterization of SPDC-based single-photon sources for quantum key distribution |
| Sprache: | Englisch |
| Publikationsjahr: | Juni 2021 |
| Ort: | Berlin ; Heidelberg |
| Verlag: | Springer |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | The European Physical Journal Special Topics |
| Jahrgang/Volume einer Zeitschrift: | 230 |
| (Heft-)Nummer: | 4 |
| DOI: | 10.1140/epjs/s11734-021-00081-5 |
| Zugehörige Links: | |
| Kurzbeschreibung (Abstract): | In our laboratory, we employ two biphoton sources for quantum key distribution. The first is based on cw parametric down-conversion of photons at 404 nm in PPKTP waveguide chips, while the second is based on the pulsed parametric down-conversion of 775 nm photons in PPLN waveguides. The spectral characterization is important for the determination of certain side-channel attacks. A Hong-Ou-Mandel experiment employing the first photon source revealed a complex structure of the common Hong-Ou-Mandel dip. By measuring the spectra of the single photons at 808 nm, we were able to associate these structures to the superposition of different transverse modes of the pump photons in our waveguide chips. The pulsed source was characterized by means of single-photon spectra measured by a sensitive spectrum analyzer as well as dispersion-based measurements. Finally, we also describe Hong-Ou-Mandel experiments using the photons from the second source. |
| Freie Schlagworte: | Condensed Matter Physics, Materials Science, general, Atomic, Molecular, Optical and Plasma Physics, Physics, general, Measurement Science and Instrumentation, Classical and Continuum Physics |
| Zusätzliche Informationen: | Part of a collection: Non-Equilibrium Systems and Foundations of Quantum Physics |
| Sachgruppe der Dewey Dezimalklassifikatin (DDC): | 500 Naturwissenschaften und Mathematik > 530 Physik |
| Fachbereich(e)/-gebiet(e): | 05 Fachbereich Physik 05 Fachbereich Physik > Institut für Angewandte Physik |
| Hinterlegungsdatum: | 11 Apr 2024 09:41 |
| Letzte Änderung: | 11 Apr 2024 09:41 |
| PPN: | |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
Verfügbare Versionen dieses Eintrags
-
Spectral characterization of SPDC-based single-photon sources for quantum key distribution. (deposited 08 Apr 2024 12:33)
- Spectral characterization of SPDC-based single-photon sources for quantum key distribution. (deposited 11 Apr 2024 09:41) [Gegenwärtig angezeigt]
 |
Frage zum Eintrag |
Optionen (nur für Redakteure)
 |
Redaktionelle Details anzeigen |
Drucken
Impressum