Alencar, I. ; Hatori, M. ; Marmitt, G. G. ; Trombini, H. ; Grande, P. L. ; Dias, J. F. ; Papaléo, R. M. ; Mücklich, A. ; Assmann, W. ; Toulemonde, M. ; Trautmann, C. (2021)
Nanoparticle emission by electronic sputtering of CaF2 single crystals.
In: Applied Surface Science, 537
doi: 10.1016/j.apsusc.2020.147821
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Material sputtered from CaF2 single crystals by 180 MeV Au ions impinging at different incidence angles were collected on high-purity amorphous C-coated Cu grids and Si(1 0 0) wafer catcher surfaces over a broad angular range. These catcher surfaces were characterized complementary by transmission electron microscopy, atomic force microscopy and medium energy ion scattering, revealing the presence of a distribution of partially buried CaF2 nanoparticles in conjunction to a thin layer of deposited CaF2 material. Particle size distributions do not follow simple power laws and depend on the angles of ion incidence and particle detection. It is shown that the particle ejection is directly related to the jet-like component of sputtering, previously observed in ionic crystals, contributing significantly to the total yield. This contribution enhances as the impinging ions approach grazing incidence. Possible scenarios for the emission of particles are discussed in light of these observations.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2021 |
| Autor(en): | Alencar, I. ; Hatori, M. ; Marmitt, G. G. ; Trombini, H. ; Grande, P. L. ; Dias, J. F. ; Papaléo, R. M. ; Mücklich, A. ; Assmann, W. ; Toulemonde, M. ; Trautmann, C. |
| Art des Eintrags: | Bibliographie |
| Titel: | Nanoparticle emission by electronic sputtering of CaF2 single crystals |
| Sprache: | Englisch |
| Publikationsjahr: | 30 Januar 2021 |
| Verlag: | Elsevier |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Applied Surface Science |
| Jahrgang/Volume einer Zeitschrift: | 537 |
| DOI: | 10.1016/j.apsusc.2020.147821 |
| Kurzbeschreibung (Abstract): | Material sputtered from CaF2 single crystals by 180 MeV Au ions impinging at different incidence angles were collected on high-purity amorphous C-coated Cu grids and Si(1 0 0) wafer catcher surfaces over a broad angular range. These catcher surfaces were characterized complementary by transmission electron microscopy, atomic force microscopy and medium energy ion scattering, revealing the presence of a distribution of partially buried CaF2 nanoparticles in conjunction to a thin layer of deposited CaF2 material. Particle size distributions do not follow simple power laws and depend on the angles of ion incidence and particle detection. It is shown that the particle ejection is directly related to the jet-like component of sputtering, previously observed in ionic crystals, contributing significantly to the total yield. This contribution enhances as the impinging ions approach grazing incidence. Possible scenarios for the emission of particles are discussed in light of these observations. |
| Freie Schlagworte: | nanoparticle, swift heavy ions, electronic sputtering, catcher technique, transmission electron microscopy, atomic force microscopy, medium energy ion scattering |
| Zusätzliche Informationen: | Artikel-ID: 147821 |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Ionenstrahlmodifizierte Materialien |
| Hinterlegungsdatum: | 29 Feb 2024 08:00 |
| Letzte Änderung: | 29 Feb 2024 08:00 |
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