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Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by x-ray reflectometry and diffractometry

Pirling, Thilo and Fricke, and Schüßler, and Lee, and Fuess, H. and Hartnagel, H. L. (1995):
Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by x-ray reflectometry and diffractometry.
In: Materials science and engineering. B 29 (1995), S. 70-73, [Article]

Item Type: Article
Erschienen: 1995
Creators: Pirling, Thilo and Fricke, and Schüßler, and Lee, and Fuess, H. and Hartnagel, H. L.
Title: Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by x-ray reflectometry and diffractometry
Language: English
Journal or Publication Title: Materials science and engineering. B 29 (1995), S. 70-73
Divisions: 11 Department of Materials and Earth Sciences
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
11 Department of Materials and Earth Sciences > Fachbereich Materialwissenschaft (1999 aufgegangen in 11 Fachbereich Material- und Geowissenschaften)
Date Deposited: 19 Nov 2008 16:23
License: [undefiniert]
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