Peters, Julian ; Zimmerer, Christoph ; Gwosch, Thomas ; Herbst, Felix ; Hartmann, Claas ; Chadda, Romol ; Riehl, David ; Keil, Ferdinand ; Kupnik, Mario ; Hofmann, Klaus ; Matthiesen, Sven (2022)
Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements.
33rd Symposium Design for X (DFX2022). Hamburg, Germany (22-23.09.2022)
doi: 10.35199/dfx2022.12
Konferenzveröffentlichung, Bibliographie
Kurzbeschreibung (Abstract)
Sensor-integrating machine elements (SiME) are essential enablers for digitization in the industry. There are major challenges in the development of SiME as an interdisciplinary mechatronic system, requiring methodical support. In this work, we address these challenges and aim to provide methods and tools by analyzing the state-of-the-art and ten ongoing projects of sensor integration in machine elements. Clustering shows similarities for example in the identification of design space or weakening of the structure. Based on this, a test-driven development process with a focus on interdisciplinary negotiations and iterations is described to overcome the challenges in developing SiME.
| Typ des Eintrags: | Konferenzveröffentlichung |
|---|---|
| Erschienen: | 2022 |
| Autor(en): | Peters, Julian ; Zimmerer, Christoph ; Gwosch, Thomas ; Herbst, Felix ; Hartmann, Claas ; Chadda, Romol ; Riehl, David ; Keil, Ferdinand ; Kupnik, Mario ; Hofmann, Klaus ; Matthiesen, Sven |
| Art des Eintrags: | Bibliographie |
| Titel: | Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements |
| Sprache: | Englisch |
| Publikationsjahr: | September 2022 |
| Buchtitel: | DS 119: Proceedings of the 33rd Symposium Design for X (DFX2022) |
| Veranstaltungstitel: | 33rd Symposium Design for X (DFX2022) |
| Veranstaltungsort: | Hamburg, Germany |
| Veranstaltungsdatum: | 22-23.09.2022 |
| DOI: | 10.35199/dfx2022.12 |
| Kurzbeschreibung (Abstract): | Sensor-integrating machine elements (SiME) are essential enablers for digitization in the industry. There are major challenges in the development of SiME as an interdisciplinary mechatronic system, requiring methodical support. In this work, we address these challenges and aim to provide methods and tools by analyzing the state-of-the-art and ten ongoing projects of sensor integration in machine elements. Clustering shows similarities for example in the identification of design space or weakening of the structure. Based on this, a test-driven development process with a focus on interdisciplinary negotiations and iterations is described to overcome the challenges in developing SiME. |
| Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Mess- und Sensortechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Datentechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Datentechnik > Integrierte Elektronische Systeme (IES) |
| Hinterlegungsdatum: | 10 Okt 2022 12:50 |
| Letzte Änderung: | 25 Apr 2023 07:37 |
| PPN: | 506469921 |
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