Artikel

Adabifiroozjaei, Esmaeil ; Rastkerdar, Ebad ; Nemoto, Yoshihiro ; Nakayama, Yoshiaki ; Nishimiya, Yuki ; Fronzi, Marco ; Yao, Yin ; Nguyen, Minh Nhut ; Molina-Luna, Leopoldo ; Suzuki, Tohru S. (2023)
In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface.
In: Journal of Materials Science
doi: 10.1007/s10853-023-08186-z
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