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Number of items: 2.

Das, Abhijit ; Atreya, Saurabh ; Mukherjee, Aritra ; Vitek, Matej ; Li, Haiqing ; Wang, Caiyong ; Zhao, Guangzhe ; Boutros, Fadi ; Siebke, Patrick ; Kolf, Jan Niklas ; Damer, Naser ; Ye, Sun ; Hexin, Lu ; Aobo, Fan ; Sheng, You ; Nathan, Sabari ; Suganya, R. ; Rampriya, R. S. ; Sharma, Geetanjali ; Priyanka, P ; Nigam, Aditya ; Peer, Peter ; Pal, Umapada ; Štruc, Vitomir (2023)
Sclera Segmentation and Joint Recognition Benchmarking Competition: SSRBC 2023.
International Joint Conference on Biometrics 2023. Ljubljana, Slovenia (25.-28.9.2023)
doi: 10.1109/IJCB57857.2023.10448601
Conference or Workshop Item, Bibliographie

Vitek, M. ; Das, A. ; Pourcenoux, Y. ; Missler, A. ; Paumier, C. ; Das, S. ; De Ghosh, I. ; Lucio, D. R. ; Zanlorensi, L. A. ; Menotti, D. ; Boutros, F. ; Damer, N. ; Grebe, J. H. ; Kuijper, A. ; Hu, J. ; He, Y. ; Wang, C. ; Liu, H. ; Wang, Y. ; Sun, Z. ; Osorio-Roig, D. ; Rathgeb, C. ; Busch, C. ; Tapia, J. ; Valenzuela, A. ; Zampoukis, G. ; Tsochatzidis, L. ; Pratikakis, I. ; Nathan, S. ; Suganya, R. ; Mehta, V. ; Dhall, A. ; Raja, K. ; Gupta, G. ; Khiarak, J. N. ; Akbari-Shahper, M. ; Jaryani, F. ; Asgari-Chenaghlu, M. ; Vyas, R. ; Dakshit, S. ; Peer, P. ; Pal, U. ; Struc, V. (2020)
SSBC 2020: Sclera Segmentation Benchmarking Competition in the Mobile Environment.
2020 IEEE International Joint Conference on Biometrics (IJCB). virtual Conference (28.09.-01.10.2020)
doi: 10.1109/IJCB48548.2020.9304881
Conference or Workshop Item, Bibliographie

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