Artikel

Romanyuk, O. ; Paszuk, A. ; Gordeev, I. ; Wilks, R.G. ; Ueda, S. ; Hartmann, C. ; Félix, R. ; Bär, M. ; Schlueter, C. ; Gloskovskii, A. ; Bartoš, I. ; Nandy, M. ; Houdková, J. ; Jiříček, P. ; Jaegermann, W. ; Hofmann, J. P. ; Hannappel, T. (2022)
Combining advanced photoelectron spectroscopy approaches to analyse deeply buried GaP(As)/Si(1 0 0) interfaces: Interfacial chemical states and complete band energy diagrams.
In: Applied Surface Science, 605
doi: 10.1016/j.apsusc.2022.154630
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