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Number of items: 2.

Vitek, M. and Das, A. and Pourcenoux, Y. and Missler, A. and Paumier, C. and Das, S. and De Ghosh, I. and Lucio, D. R. and Zanlorensi, L. A. and Menotti, D. and Boutros, F. and Damer, N. and Grebe, J. H. and Kuijper, A. and Hu, J. and He, Y. and Wang, C. and Liu, H. and Wang, Y. and Sun, Z. and Osorio-Roig, D. and Rathgeb, C. and Busch, C. and Tapia, J. and Valenzuela, A. and Zampoukis, G. and Tsochatzidis, L. and Pratikakis, I. and Nathan, S. and Suganya, R. and Mehta, V. and Dhall, A. and Raja, K. and Gupta, G. and Khiarak, J. N. and Akbari-Shahper, M. and Jaryani, F. and Asgari-Chenaghlu, M. and Vyas, R. and Dakshit, S. and Peer, P. and Pal, U. and Struc, V. (2020):
SSBC 2020: Sclera Segmentation Benchmarking Competition in the Mobile Environment.
IEEE, 2020 IEEE International Joint Conference on Biometrics (IJCB), virtual Conference, 28.09.-01.10.2020, ISBN 978-1-7281-9186-7,
DOI: 10.1109/IJCB48548.2020.9304881,
[Conference or Workshop Item]

Niedermaier, O. and Scheit, H. and Bildstein, V. and Boie, H. and Fitting, J. and von Hahn, R. and Köck, F. and Lauer, M. and Pal, U. and Podlech, H. and Repnow, R. and Schwalm, D. and Alvarez, C. and Ames, F. and Bollen, G. and Emhofer, S. and Habs, D. and Kester, O. and Lutter, R. and Rudolph, K. and Pasini, M. and Thirolf, P. and Wolf, B. and Eberth, J. and Gersch, G. and Hess, H. and Reiter, P. and Thelen, O. and Warr, N. and Weisshaar, D. and Aksouh, F. and Van den Bergh, P. and Van Duppen, P. and Huyse, M. and Ivanov, O. and Mayet, P. and Van de Walle, J. and Äystö, J. and Butler, P. and Cederkäll, J. and Delahaye, P. and Fynbo, H. and Fraile, L. and Forstner, O. and Franchoo, S. and Köster, U. and Nilsson, T. and Oinonen, M. and Sieber, T. and Wenander, F. and Pantea, M. and Richter, A. and Schrieder, G. and Simon, H. and Behrens, T. and Gernhäuser, R. and Kröll, T. and Krücken, R. and Münch, M. and Davinson, T. and Gerl, J. and Huber, G. and Hurst, A. and Iwanicki, J. and Jonson, B. and Lieb, P. and Liljeby, L. and Schempp, A. and Scherillo, A. and Schmidt, P. and Walter, G. (2005):
“Safe” Coulomb Excitation of Mg30.
In: Physical Review Letters, 94 (17), ISSN 0031-9007,

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